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X射线荧光光谱法快速测定FeSiB非晶薄带中Si,B,Fe的含量合金薄带中硅硼铁
引用本文:王瑶,李艳萍,冯圣雅,李健靓. X射线荧光光谱法快速测定FeSiB非晶薄带中Si,B,Fe的含量合金薄带中硅硼铁[J]. 中国无机分析化学, 2015, 5(4)
作者姓名:王瑶  李艳萍  冯圣雅  李健靓
作者单位:安泰科技股份有限公司,安泰科技股份有限公司,安泰科技股份有限公司,安泰科技股份有限公司
基金项目:北京市科委技术研究项目
摘    要:提出了以自制的标准样品,采用单点法绘制校准曲线,利用X射线荧光光谱仪测定FeSiB非晶薄带样品中硅、硼和铁的含量。对于4个FeSiB非晶合金薄带样品中硅、硼和铁进行了10次测定,其分析结果的相对标准偏差分别为0.4~0.5%,1.3~4.2%和0.2~0.4%。本方法的分析结果与火花源原子发射光谱法、化学重量法和ICP-AES的测定值吻合较好。本方法快速、简便,薄带样品无需制样,适用于FeSiB非晶合金薄带的快速成分分析。

关 键 词:X射线荧光光谱法(XRF)  FeSiB非晶合金薄带  FeSiB合金  单点法
收稿时间:2015-06-02

Rapid Determination of Fe, Si, BSilicon,Boron,Iron in FeSiB Amorphous Alloy Film by ribbons by X-ray Fluorescence Spectrometry
WANG Yao,LI Yan-ping,FENG Sheng-ya and LI Jian-liang. Rapid Determination of Fe, Si, BSilicon,Boron,Iron in FeSiB Amorphous Alloy Film by ribbons by X-ray Fluorescence Spectrometry[J]. Chinese Journal of Inorganic Analytical Chemistry, 2015, 5(4)
Authors:WANG Yao  LI Yan-ping  FENG Sheng-ya  LI Jian-liang
Affiliation:Advanced Technology Materials Co.,Ltd.,Advanced Technology Materials Co.,Ltd.,Advanced Technology Materials Co.,Ltd.,Advanced Technology Materials Co.,Ltd.
Abstract:A method for the determination of silicon, boron and iron in FeSiB amorphous alloy film, carried out the calibration curves with self-made standard sample and single spot method, by n X-ray fluorescence spectrometric spectrometry was proposed. Under the analytical optimum condition, silicon, boron and iron in 4 FeSiB amorphous alloy film samples were determined, values of RSD (n=10) for silicon, boron and iron were 0.4-0.5%, 1.3-4.2% and 0.2-0.4%, respectively. The analytical results with thoseobtained by the proposed method were in good accordance with those by spark source atomic Eemission Sspectormetry, Cchemical gravimetric method and ICP-AES for soame furnace No FeSiB alloy block and FeSiB amorphous alloy film samples.
Keywords:X-ray fluorescence spectrometry (XRF)   Fe-Si-B amorphous alloy ribbonfilm   Single single point method   FeSiB alloy.
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