Improved sectioning in a slit scanning confocal microscope |
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Authors: | Poher Vincent Kennedy Gordon T Manning Hugh B Owen Dylan M Zhang Haoxiang X Gu Erdan Dawson Martin D French Paul M W Neil Mark A A |
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Institution: | Photonics Group, Blackett Laboratory, Department of Chemistry, Imperial College London, London, UK. vincent.poher03@imperial.ac.uk |
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Abstract: | We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case. |
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