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Dopant diffusion and segregation in semiconductor heterostructures: Part 2. B in GexSi1-x/Si structures
Authors:C-H Chen  UM Gösele  TY Tan
Institution:(1) Department of Mechanical Engineering and Materials Science, Duke University, Durham, NC 27708-0300, USA, US
Abstract:x Si1-x/Si heterostructures have been obtained. Here the chemical effects seem to be of less importance. The Fermi-level effect determines the ionized boron solubilities in GexSi1-x and in Si, as well as the thermal equilibrium concentration of the singly-positively-charged crystal self-interstitials I+ which governs the boron diffusion process. The junction carrier concentration affects the concentration of I+ and solubility of B in the region and hence controls B diffusion across the heterojunction. Received: 20 August 1998/Accepted: 23 September 1998
Keywords:PACS: 61  72  Tt  61  72  Ss  61  72  Yx
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