Infrared regular reflectance and transmittance instrumentation and standards at NIST |
| |
Authors: | S G Kaplan and L M Hanssen |
| |
Institution: | Optical Technology Division, NIST Gaithersburg, MD 20899 USA |
| |
Abstract: | Instrumentation is described that has been constructed at the National Institute of Standards and Technology (NIST) for the measurement of regular reflectance and transmittance over the 2–25 μm wavelength region. This includes both specialized accessories used with Fourier-transform infrared (FT-IR) spectrometers and laser-based systems for high optical density transmittance measurements. The FT-IR systems have been used to develop standard reference materials for IR regular transmittance. |
| |
Keywords: | Infrared regular reflectance Transmittance FT-IR measurements Beam geometry |
本文献已被 ScienceDirect 等数据库收录! |