Enhancement of the Kerr effect in magnetooptical DyFeCo/GeO carriers

The optimum parameters of a dielectric layer near the substrate in the interference multilayer structure are calculated. The calculations showed that this layer should have the index of refraction n∼3. The results are presented of measuring the Kerr angle of magnetooptical rotation in the multilayer structure, in which GeO films were used as dielectric layers for the first time. The maximum Kerr angle of rotation and magnetooptical quality observed in this system were 0.75° and 0.34°, respectively. These values exceed those inherent in the known information carriers, which demonstrates the advantage of this structure for use in magnetooptical discs.