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Structures and electronic transport on silicon surfaces
Authors:Shuji Hasegawa   Xiao Tong   Sakura Takeda   Norio Sato  Tadaaki Nagao  
Affiliation:

a Department of Physics, School of Science, University of Tokyo, Hongo, Bunkyo-ku, Tokyo, 113-0033, Japan

b Core Research for Evolutional Science and Technology (CREST), The Japan Science and Technology Corporation (JST), Kawaguchi Center Bldg, Hon-cho 4-1-8, Kawaguchi, Saitama, 332-0012, Japan

Abstract:By utilizing a variety of surface superstructures formed on silicon surfaces and atomic layers grown on them, close correlations between the atomic-scale structures and electrical conduction phenomena at the surfaces have been revealed. State-of-art techniques for analyzing and controlling atomic/electronic structures of surfaces are leading to an understanding of the novel electronic transport properties at surfaces. For example, the electrical conduction through surface-state bands, which are inherent in the surface superstructure, has been confirmed in in-situ measurements. An important phenomenon has also been found, where adatoms donate carriers into the surface-state band, resulting in a remarkable enhancement in electrical conductance. The nucleation of the adatoms diminishes such a doping effect. Furthermore, electrical conduction through atomic layers grown on the surfaces, whose growth structures are sensitive to the substrate surface structures, will be also discussed. In this review, we emphasize that the surface electronic transport properties are closely related to the atomic structures and atomistic dynamics on surfaces. The ultimate two-dimensional electron systems, consisting of the surface-state bands and grown atomic layers, are expected to provide a new stage in surface physics, as well as a precursory stage leading to atomic-scale electronics devices.
Keywords:
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