DLTS studies of deep levels in semiconducting N-CdTe single crystals

Deep levels created by annealing of Al-doped n-CdTe single crystals have been studied by the Deep Level Transient Spectroscopy (DLTS) technique. Eight levels have been detected in the energy range from 0.04 to 0.07 eV below the conduction band edge. The thermal ionization energies and the capture cross sections for electrons in these levels have been obtained. The dependence of concentrations of the levels on the Cd vapor pressure during annealing and on the cooling process after annealing has been determined.