Noise as reliability screening for semiconductor lasers |
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| Authors: | H Guijun S Jiawei G Yinbing Y Xiaosong L Jing |
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| Institution: | (1) Department of Optical Communication, College of Communication Engineering, Jilin University, Changchun 130012, P.R. China, CN;(2) Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130021, P.R. China, CN;(3) College of Electronics Engineering, Jilin University, Changchun 130023, P.R. China, CN |
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| Abstract: | The low-frequency electrical noise in semiconductor lasers is measured and used for device-reliability screening, which is
a sensitive and non-destructive method. In the experiment, we developed some approaches to improve the validity of reliability
screening by using noise criteria. A new method of determining the threshold level of noise criteria is given. The experimental
results show that this method is effective.
Received: 26 September 2002 / Revised version: 28 January 2003 / Published online: 9 April 2003
RID="*"
ID="*"Corresponding author. Fax: +86-431/462-7013, E-mail: huguijun@sina.com |
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| Keywords: | PACS: 42 55 Px 42 60 Mi |
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