Spatially resolved piezo-spectroscopic characterizations for the validation of theoretical models of notch-root stress fields in ceramic materials

The main aim of this work is a precise experimental assessment of the local stress fields developed at the notch-root in a ruby crystal, selected as a paradigm brittle material, by means of photo- and electron-stimulated luminescence techniques. Our approach takes advantage of the piezo-spectroscopic (PS) effect, which consists of a spectral shift of the luminescence emitted by the material due to lattice strain. Highly spatially resolved stress maps were extensively collected at the notch-root and spectral shifts monitored for the chromophoric (R-lines) fluorescence observed in a single-crystalline ruby sample. Experimental data were analyzed and compared to the theoretical solutions of notch-root stress fields given by Filippi and by Creager-Paris. Due to its inherent simplifications, the Creager–Paris solution was found leading to underestimation of the maximum stress value piled up in the material, while the Filippi’s solution represented a more suitable approximation for the stress field developed at the notch-root.