Evaluation of spectral phase in spectrally resolved white-light interferometry: Comparative study of single-frame techniques |
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Authors: | Sanjit K Debnath Mahendra P Kothiyal Seung-Woo Kim |
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Institution: | aPEM Laboratory, Department of Mechanical Engineering, KAIST, Daejeon, South Korea;bApplied Optics Laboratory, Department of Physics, IIT Madras, Chennai, India |
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Abstract: | Spectral phase in a white-light interferogram contains information about the absolute optical path difference (OPD) in the interferometer. Evaluation of spectral phase is therefore important in applications such as profilometry with white light. In spectrally resolved white-light interferometry (SRWLI) the white-light interferogram is spectrally decomposed by a spectrometer in order to determine this phase. Several single-frame techniques in SRWLI have been proposed for the evaluation of the phase including Fourier transform, Hilbert transform, spatial phase shifting, windowed Fourier transform and wavelet transform. In this paper we present a comparative study of these techniques in this application in relation to the temporal phase-shifting technique which is a multi- frame method. Further, we also propose a modified method to remove the influence of source spectrum modulation in Hilbert transform procedure. |
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Keywords: | White-light interferometry Spectral interferogram analysis Hilbert transform Phase-shifting interferometry Windowed Fourier transform Wavelet transform |
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