The transverse correlation length for randomly rough surfaces |
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Authors: | A. A. Maradudin T. Michel |
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Affiliation: | (1) Department of Physics and Institute for Surface and Interface Science, University of California, 92717 Irvine, California |
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Abstract: | It is shown by numerical simulations for a random, one-dimensional surface defined by the equationx3=(x1), where the surface profile function (x1) is a stationary, stochastic, Gaussian process, that the transverse correlation lengtha of the surface roughness is a good measure of the mean distance d between consecutive peaks and valleys on the surface. In the case that the surface height correlation function (x1)(x1)/2(x1)=W (|x1–x1|) has the Lorentzian formW(|x1|)=a2/(x12+a2) we find that d=0.9080a; when it has the Gaussian formW(|x1|)=exp(–x12/a2), we find that d=1.2837a; and when it has the nonmonotonic formW(|x1|)=sin(x1/a)/(x1/a), we find that d=1.2883a. These results suggest that d is larger, the faster the surface structure factorg(|Q|) [the Fourier transform ofW(|x1|)] decays to zero with increasing |Q|. We also obtain the functionP(itx1), which is defined in such a way that, ifx1=0 is a zero of (x1),P(x1)dx1 is the probability that the nearest zero of (x1) for positivex1 lies betweenx1 andx1+dx1. |
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Keywords: | Transverse correlation length rough surfaces |
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