Near-edge x-ray absorption fine-structure investigation of graphene |
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Authors: | Pacilé D Papagno M Rodríguez A Fraile Grioni M Papagno L Girit C O Meyer J C Begtrup G E Zettl A |
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Institution: | Istituto Nazionale di Fisica Nucleare (INFN) and Dipartimento di Fisica Università della Calabria, 87036 Arcavacata di Rende, Cosenza, Italy. dpacile@fis.unical.it |
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Abstract: | We report the near-edge x-ray absorption fine-structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of highly ordered pyrolytic graphite on a SiO2 substrate. We utilized a photoemission electron microscope to separately study single-, double-, and few-layers graphene samples. In single-layer graphene we observe a splitting of the pi resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers. |
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