椭圆偏振光谱方法对电化学的研究及应用

椭圆偏振光在固体表面入射和反射后，光学参量△，Ψ及其所表征的偏振状态，将因固体表面膜的厚度、性质不同而发生相应的变化．测定△，Ψ及其变化规律、可为固体材料、表面膜厚度、表面或界面上发生的有关物理或化学变化等直接或间接地提供信息，其灵敏度可反映表面膜层０．１～０．０１ｎｍ厚度的变化．因此，椭圆偏振光谱（下称椭圆法）在固体物理、表面化学、金属表面腐蚀、生物大分子表面等研究领域具有重要价值［１］．该法能检测的表面膜厚相当于电极上的单分子层的尺寸，特别适用于从分子水平上研究电化学体系，是最灵敏的光谱电化…

Spectroellipsometric Studies on Electrochemistry and its Application

Ellipsometric measurements are often extremely sensitive to the presence of very thin surface layers,to changes in their thickness(or coverage),and to changes in surface topography at an atomic scale.These characteristics make the use of ellipsometry for electrochemical studies particularly attractive.The ellipsometric studies on electrochemistry and its applications carried out in the Electrochemical Laboratory of Chongqing University are reviewed briefly: 1)The studies on electrochemistry of classical ellipsometry: 2)The new function V op suggested by the authors. 3)The applications of new approcaches with new function V op suggested by the authors.