Anisotropic dielectric constant of TTF-TCNQ observed by dielectric resonance |
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| Authors: | S.K. Khanna A.F. Garito A.J. Heeger R.C. Jaklevic |
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| Affiliation: | Ford Research Laboratories, Dearborn, Michigan 48121, U.S.A. |
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| Abstract: | Independent measurements at low temperatures of the anisotropic dielectric constant (∈1) of TTF-TCNQ are reported. The measurements utilize dielectric resonance techniques to determine ∈B1 and ∈a1 on the same crystal. The results confirm the unusually large value for ∈b1(4.2 K) > 103 and the anisotropic behavior ∈b1(4.2 K) > 102 found earlier in cavity perturbation studies of TTF-TCNQ. |
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