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Photoluminescence study of native defects in annealed GaAs
Authors:PK Chatterjee  KV Vaidyanathan  MS Durschlag  BG Streetman
Institution:Coordinated Science Laboratory and Department of Electrical Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801, U.S.A.
Abstract:Low temperature (6°K) photoluminescence measurements have been performed on GaAs annealed under various conditions, to study defects generated by outdiffusion of the constituent atoms. Several defect-related luminescence peaks have been observed and associated with Ga and As outdiffusion. The outdiffusion of these elements during annealing to 850°C in vacuum and with Ga or As overpressure and SiO2 coatings is studied by monitoring the intensities of these peaks.
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