The defect structure of CdTe: Self-diffusion data |
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| Authors: | S.S. Chern F.A. Kroger |
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| Affiliation: | Department of Materials Science, University of Southern California, University Park, Los Angeles, California 90007, USA |
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| Abstract: | Cadmium and Te tracer self-diffusion was studied for pure and indium-doped CdTe. Analysis of the results leads to a point defect model in which imperfections with various charges play a role. Expressions for the tracer diffusion coefficients by various mechanisms and for the diffusion coefficients of individual point defects are derived. |
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