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Enhanced localized fields in oblique incidence and their relation to laser damage in transparent dielectrics
Authors:N. Bareket  C. Bar-Isaac
Affiliation:Department of Electronics, The Weizmann Institute of Science, Rehovot, Israel
Abstract:Interference of incident and reflected light waves at the surfaces of transparent dielectrics causes enhanced localized fields. Calculations are presented for the case of oblique incidence on a parallel surfaces slab for entrance and exit surfaces, and their relation to laser surface damage studies is considered.
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