Enhanced localized fields in oblique incidence and their relation to laser damage in transparent dielectrics |
| |
Authors: | N. Bareket C. Bar-Isaac |
| |
Affiliation: | Department of Electronics, The Weizmann Institute of Science, Rehovot, Israel |
| |
Abstract: | Interference of incident and reflected light waves at the surfaces of transparent dielectrics causes enhanced localized fields. Calculations are presented for the case of oblique incidence on a parallel surfaces slab for entrance and exit surfaces, and their relation to laser surface damage studies is considered. |
| |
Keywords: | |
本文献已被 ScienceDirect 等数据库收录! |
|