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扫描探针显微学在材料表面纳米级结构研究中的新进展
引用本文:白春礼,林璋.扫描探针显微学在材料表面纳米级结构研究中的新进展[J].物理,1999,28(1):27-30.
作者姓名:白春礼  林璋
作者单位:中国科学院化学研究所
基金项目:国家自然科学基金,中国科学院资助
摘    要:应用扫描探针显微技术(SPM)「包括扫描隧道显微镜(STM)、原子力显微镜(AFM)、磁力显微镜(MFM)等」,比较系统地研究了一些无机、有机和生物材料的表面精细结构;在极高分辨率的水平上,解释了如C60Langmuir-Blodgett膜、有机磁性薄膜的样品制备、形成条件的关系;研究并揭示了碱金属与半志体表面吸附相互作用,红细胞表面结构等;拓宽了扫描探针显微技术的范围,在实验方法和研究成果上具有

关 键 词:扫描探针显微学  材料表面  纳米级结构

ADVANCES IN THE STUDY OF NANOSCALE SURFACE STRUCTURES BY SCANNING PROBE MICROSCOPY
Bai Chunli Lin Zhang.ADVANCES IN THE STUDY OF NANOSCALE SURFACE STRUCTURES BY SCANNING PROBE MICROSCOPY[J].Physics,1999,28(1):27-30.
Authors:Bai Chunli Lin Zhang
Institution:Bai Chunli Lin Zhang (Institute of Chemistry,The Chinese Academy of Sciences,Beijing 100080)
Abstract:The fine strucutres of several kinds of organic,inorganic and biological materials have been investigated using scanning tunneling microscopy,atomic force microscopy and magnetic force microscopy.The relationship between the structures and the sample preparation methods of films such as C 60 Langmuir-Blodgett films and organic magnetic films have been explained.The adsorption of alkali metals on semiconductor surfaces and the fine structure of red blood cells have been studied in detail.The experimental methods are novel and the results new,further expanding the field of application of scanning probe microscopy.
Keywords:scanning probe microscopy  nanoscale structures of the materials    c9
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