Double shearography for engineering metrology: optical and digital approach |
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| Authors: | V. M. Murukeshan Ng Chee Keong Krishnakumar. V Ong Lin Seng A. Asundi |
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| Affiliation: | School of Mechanical and Production Engineering, Nanyang Technological University, North Spine (N3), Level 2, Nanyang Avenue, 639798, Singapore |
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| Abstract: | This paper presents a double shearographic configuration based on the optical method by using two Michelson interferometers in tandem. The problems associated with the extraction of second order derivatives by optical means and a comparison with the proposed novel approach by digital means are discussed in this paper. |
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| Keywords: | Shearography Curvature ESPI Image processing Metrology |
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