XRF and PIXE analysis of metallic glasses

Radionuclide X-ray fluorescence (XRF) and particle induced X-ray emission (PIXE) methods have been used for a rapid and nondestructive analysis of metallic glasses. The methods are compared in accuracy and precision with the atomic absorption method. Some results of analyses of Fe_xNi₈₀-_xB₂₀ materials are briefly reviewed. The distribution of elements along the width as well as length and a qualitative analysis of the composition of material surfaces are considered.