Analysis of non-organic elements in plant foliage using polarised X-ray fluorescence spectrometry

An X-ray fluorescence (XRF) method for the rapid and non-destructive analysis of 30 non-organic elements in plant leaves over five orders of magnitude concentration from several percentage of dry weight to sub-milligram per kilogram, is described. There is a growing need for a simple method of monitoring non-organic trace elements in plant material, especially those which accumulate in soils with application of fertilisers, both inorganic and biosolids. Earlier attempts to use XRF for the analysis of plant material suffered from sensitivity loss due to the high background of organic matrices caused by scattering of the X-ray source. We overcome this by using polarised X-ray sources in a Cartesian geometrical arrangement with sample and energy dispersive detector (EDPXRF), a configuration which can achieve an order of magnitude reduction in background compared with unpolarised sources. Further sensitivity gains are made using a high power tube as a source of primary X-rays and for some analytes employing secondary targets for near-monochromatic excitation. Sample preparation is simple involving only pulverising and briquetting of dried samples. Accuracy is evaluated by comparing data obtained for the suite of NIST plant leaf samples (NIST 1515 apple leaves, NIST 1547 peach leaves, NIST 1570a spinach leaves, NIST 1573a tomato leaves and NIST 1575a pine needles) and tobacco leaf standards CTA-OTL-1 and CTA-VTL-2. The data compare well over the whole concentration range and the method provides a rapid analytical tool for monitoring potentially toxic trace elements in all types of foliage with adequate sensitivity for many purposes.