首页 | 本学科首页   官方微博 | 高级检索  
     


Measurement of surface resistivity/conductivity of different organic thin films by a combination of optical shearography and electrochemical impedance spectroscopy
Authors:Khaled Habib
Affiliation:1. Materials Science and Photo-Electronics Lab., IRE Program, EBR Center, KISR, P. O. Box 24885, Safat, 13109, Kuwait
Abstract:Shearography techniques were applied again to measure the surface resistivity/conductivity of different organic thin films on a metallic substrate. The coatings were ACE premium-grey enamel (spray coating), a yellow Acrylic lacquer, and a gold nail polish on a carbon steel substrate. The investigation was focused on determining the in-plane displacement of the coatings by shearography between 20 and 60 °C. Then, the alternating current (AC) impedance (resistance) of the same coated samples was determined by electrochemical impedance spectroscopy (EIS) in 3.0% NaCl solution at room temperature. As a result, the proportionality constant (resistivity or conductivity = 1/surface resistivity) between the determined AC impedance and the in-plane displacement was obtained. The obtained resistivity of all investigated coatings, 40:15 × 106–24:6 × 109Ωcm, was found in the insulator range.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号