Measurement of surface resistivity/conductivity of different organic thin films by a combination of optical shearography and electrochemical impedance spectroscopy |
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Authors: | Khaled Habib |
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Affiliation: | 1. Materials Science and Photo-Electronics Lab., IRE Program, EBR Center, KISR, P. O. Box 24885, Safat, 13109, Kuwait
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Abstract: | Shearography techniques were applied again to measure the surface resistivity/conductivity of different organic thin films on a metallic substrate. The coatings were ACE premium-grey enamel (spray coating), a yellow Acrylic lacquer, and a gold nail polish on a carbon steel substrate. The investigation was focused on determining the in-plane displacement of the coatings by shearography between 20 and 60 °C. Then, the alternating current (AC) impedance (resistance) of the same coated samples was determined by electrochemical impedance spectroscopy (EIS) in 3.0% NaCl solution at room temperature. As a result, the proportionality constant (resistivity or conductivity = 1/surface resistivity) between the determined AC impedance and the in-plane displacement was obtained. The obtained resistivity of all investigated coatings, 40:15 × 106–24:6 × 109Ωcm, was found in the insulator range. |
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