| 低温微波近场显微镜及其在材料研究中的应用 |
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| 引用本文： | 姜田,吴立勇,冯一军. 低温微波近场显微镜及其在材料研究中的应用[J]. 低温物理学报, 2004, 26(3): 232-236 |
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| 作者姓名： | 姜田 吴立勇 冯一军 |
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| 作者单位： | 南京大学,电子科学与工程系,南京,210093;南京大学,电子科学与工程系,南京,210093;南京大学,电子科学与工程系,南京,210093 |
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| 摘 要： | 微波近场技术是研究材料表面区域电磁性质的有效手段,结合低温技术则可将这种技术的应用拓展到更广的范围.本文报道了我们研制的低温扫描微波近场显微镜系统,它由微波近场显微镜和与之配合的可变温样品台构成,可以在液氮温度和室温之间工作.利用该系统我们详细研究了YBaCuO超导薄膜、NdSrMnO磁性薄膜在不同温度条件下的电磁性质,给出了相关实验结果.研究表明微波近场技术与低温技术的结合为电子材料和器件低温下局域电磁性质的研究提供了有力的手段.
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| 关 键 词： | 微波近场技术 无损检测 超导薄膜 磁性材料 |
| 修稿时间： | 2003-12-15 |
LOW TEMPERATURE SCANNING MICROWAVE NEAR-FIELD MICROSCOPE AND ITS APPLICATION ON MATERIAL RESEARCH |
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| JIANG TIAN WU LI-YONG FENG YI-JUN. LOW TEMPERATURE SCANNING MICROWAVE NEAR-FIELD MICROSCOPE AND ITS APPLICATION ON MATERIAL RESEARCH[J]. Chinese Journal of Low Temperature Physics, 2004, 26(3): 232-236 |
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| Authors: | JIANG TIAN WU LI-YONG FENG YI-JUN |
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| Affiliation: | JIANG TIAN WU LI-YONG FENG YI-JUN Department of Electronic Science and Engineering,Nanjing University,Nanjing 210093 |
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| Abstract: | Microwave near-field technique has been proved to be an effective tool for studying the local microwave properties of materials. In this paper, we present our low temperature scanning microwave near-field microscope system by combining the microwave near-field technique with a precisely designed low temperature sample stage. Using this system, we have investigated the local temperature dependent microwave properties of YBaCuO superconducting thin film and NdSrMnO magnetic thin film. From the experimental results, we believe that this instrument will be very helpful in the measurement of the local microwave properties of electronic materials. |
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| Keywords: | microwave near-field technique nondestructive testing superconducting thin film magnetic material |
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