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超高速大电流半导体开关实验研究
引用本文:周郁明,余岳辉,梁琳,陈海刚.超高速大电流半导体开关实验研究[J].强激光与粒子束,2006,18(3):447-450.
作者姓名:周郁明  余岳辉  梁琳  陈海刚
作者单位:华中科技大学 电子科学与技术系, 武汉 430074
基金项目:国家自然科学基金资助课题(50277016,50577028),高等学校博士点基金资助课题(20050487044),国家973项目资助课题(5132802)
摘    要: 利用自行研制的固态半导体开关RSD,采用电容储能方式,研究了RSD的电压响应时间、大电流特性、电流上升率等。在测试RSD的电压响应时间时,得到了25 ns的电压下降曲线。在主电容电压为8 kV时,得到峰值为10.1 kA、脉宽为34 μs、电流上升率为2.03 kA/μs的大电流脉冲。通过调整主电路,在主电容为3 kV时,得到的电流脉冲峰值为8.5 kA、脉宽为2.5 μs、电流上升率为7.2 kA/μs。结果表明,RSD是一种开通快、通流能力强、电流上升率高的大功率半导体开关器件。

关 键 词:半导体开关  RSD  等离子体  大电流  电流上升率
文章编号:1001-4322(2006)03-0447-04
收稿时间:2005-08-30
修稿时间:2005-12-27

Experimental investigation of ultrafast and high current semiconductor switch
ZHOU Yu-ming,YU Yue-hui,LIANG Lin,CHEN Hai-gang.Experimental investigation of ultrafast and high current semiconductor switch[J].High Power Laser and Particle Beams,2006,18(3):447-450.
Authors:ZHOU Yu-ming  YU Yue-hui  LIANG Lin  CHEN Hai-gang
Institution:Department of Electronic Society and Technology, Huazhong University of Science and Technology, Wuhan 430074, China
Abstract:Some interesting characteristics of the solid-state semiconductor switch, the reverse switching dynistor(RSD), such as the time of voltage fall, current carrying capability and current rise rate, were investigated under the condition of being the closing switch of capacitive energy storage. A 25 ns voltage-falling time was achieved. When the voltage of main capacitor was 8 kV, the peak value of current pulse was 10.1 kA, pulse width and current rise rate were 34 μs and 2.03 kA/μs respectively. After adjusting parameters of the main discharge circuit, a current pulse was obtained at peak current of 8.5 kA with current rise rate of 7.2 kA/μs only when the main capacitor voltage was 3 kV. Experimental results show that RSD is a new type of high power semiconductor switch with fast turn-on,
Keywords:High current carrying copability  Semiconductor switch  RSD  Plasma  High current  Current rise rate
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