Investigation of dielectric aging in layered ferroelectrics |
| |
| Authors: | Yu. V. Kochergin A. I. Burkhanov K. Bormanis A. Kalvane M. Dambekalne |
| |
| Affiliation: | (1) Volgograd State University of Architecture and Civil Engineering, Akademicheskaya ul. 1, Volgograd, 400074, Russia;(2) Institute of Solid State Physics, University of Latvia, Kengaraga str. 8, Riga, LV, 1063, Latvia |
| |
| Abstract: | The specific features of long-term relaxation of the polarization in the Na0.5Bi8.5Ti2Nb4O27 and Na0.5Bi8.5Ti2Ta4O27 ceramic materials with different prehistories are investigated. It is established that, for the Na0.5Bi8.5Ti2Nb4O27 and Na0.5Bi8.5Ti2Ta4O27 ceramic materials, a change in the measurement conditions, including heating or cooling to the temperature T a under investigation, leads to a change in the time dependence ε′(t) describing the dielectric aging of the material at T a = const. The results obtained are discussed from the viewpoint of the possible existence of defect complexes in disordered ferroelectrics. |
| |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ |
|
