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X射线照片密度与显微密度计信号电压之间关系的实验探讨
引用本文:李月卿,王昌元,郑浩,李建民,王军. X射线照片密度与显微密度计信号电压之间关系的实验探讨[J]. 光学技术, 2001, 27(4): 340-341
作者姓名:李月卿  王昌元  郑浩  李建民  王军
作者单位:1. 泰山医学院放射系,
2. 济南铁路局泰安铁路医院
基金项目:山东省教育厅科研资助项目
摘    要:探索了 X射线照片密度与显微密度计信号电压之间的关系。利用曲线拟合得到了 X射线照片光密度与输出电压关系的公式。经公式计算的密度值与实测密度值之间差别不大 ,其标准估计误差为 0 .0 178,完全可以用计算密度值来代替实测密度值。直接取其显微密度计输出的电信号 ,经公式转换成光学密度值后再进行 X射线照片的各种性能测试 ,避免了部分测试和换算误差 ,克服了过去密度测量的不便 ,提高了效率

关 键 词:显微密度计  输出电压  光学密度
文章编号:1002-1582(2001)04-0340-02
修稿时间:2001-01-03

The research on the relation between the optics density of the X-ray and the output information voltage of micro-densimeter
LI Yue qing ,WANG Chang yuan ,ZHENG Hao ,LI Jian min ,WANG Jun. The research on the relation between the optics density of the X-ray and the output information voltage of micro-densimeter[J]. Optical Technique, 2001, 27(4): 340-341
Authors:LI Yue qing   WANG Chang yuan   ZHENG Hao   LI Jian min   WANG Jun
Affiliation:LI Yue qing 1,WANG Chang yuan 1,ZHENG Hao 1,LI Jian min 1,WANG Jun 2
Abstract:The relation between the optics density of the X ray and the output information voltage of micro densimeter is investigated. A formula which would describe the relation between the optics density and the output information voltage is obtained by a mathematics method. The difference between calculating density values and measuring valuts is small, the standard error of estimate is 0.0178. The measuring value may be replaced by the calculating value from output voltage getted from the micro densimeter. The error is avoided partly and the information data from voltage output of micro densimeter is got directly. It is more convenient and higher efficient.
Keywords:micro densimeter  output voltage  optics density  
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