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SURFACE STRUCTURE DETERMINATION BY STM vs LEED |
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| Authors: | M. A. VAN HOVE J. CERDA P. SAUTET M. -L. BOCQUET M. SALMERON |
| Affiliation: | a Materials Sciences Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, CA 94720 USA b Institut de Recherche sur la Catalyse, 2 av. A. Einstein, 69626 Villeurbanne Cedex France c École Normale Supérieure, 69364 Lyon Cedex 07 France |
| Abstract: | Scanning tunneling microscopy has been developed, among other applications, into a powerful surface structural tool. Over time, it has become more apparent that theoretical modeling of the STM image is often necessary to reliably extract atomic positions. We here review recent advances in this direction and illustrate with several examples that geometrical information is mixed not only with electronic structure information and corresponding tip properties, but also with tunneling effects like interference between multiple tunneling channels. |
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