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Josephson junctions as threshold detectors for full counting statistics
Authors:Tobiska J  Nazarov Yu V
Affiliation:Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands.
Abstract:We discuss how threshold detectors can be used for a direct measurement of the full distribution of current fluctuations and how to exploit Josephson junctions in this respect. We propose a scheme to characterize the full counting statistics from the current dependence of the escape rate measured. We illustrate the scheme with explicit results for tunnel, diffusive, and quasiballistic mesoscopic conductors.
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