Long-lived charge-separated state leading to DNA damage through hole transfer |
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| Authors: | Kawai Kiyohiko Takada Tadao Nagai Takayoshi Cai Xichen Sugimoto Akira Fujitsuka Mamoru Majima Tetsuro |
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| Affiliation: | The Institute of Scientific and Industrial Research (SANKEN), Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047, Japan. kiyohiko@sanken.osaka-u.ac.jp |
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| Abstract: | The hole transfer causes the long-lived charge-separated state in DNA during the photosensitized one-electron oxidation of DNA. The combination of the transient absorption measurement and DNA damage quantification by HPLC clearly demonstrated that the yield of the DNA damage correlates well with the lifetime of the charge-separated state. |
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