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Improved sequential estimation of means of exponential distributions
Authors:N Mukhopadhyay
Institution:(1) Department of Statistics, University of Connecticut, 196 Auditorium Road, U Box 120, 06269 Storrs, CT, U.S.A.
Abstract:Both one-sample and multi-sample estimation problems for the means of one parameter exponential distributions are addressed. In the one-sample case, for the existing purely sequential and recently obtained piecewise sequential estimation methodologies, we follow and extend the development in Isogai and Uno (1993,Ann. Inst. Statist. Math. (in press)) in order to obtain a class of estimators that provides asymptotic second-order risk improvement. In the multi-sample problem, we address the analogous aspects for the existing purely sequential methodology as well as the newly developed piecewise methodology.
Keywords:Risk improvement  second-order asymptotics  exponential distributions  sequential methods  piecewise sequential methods  one-sample problems  multi-sample problems
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