Dielectric profile of interfacial water and its effect on double-layer capacitance |
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Authors: | Bonthuis Douwe Jan Gekle Stephan Netz Roland R |
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Institution: | Physik Department, Technische Universit?t München, 85748 Garching, Germany. |
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Abstract: | The framework for deriving tensorial interfacial dielectric profiles from bound charge distributions is established and applied to molecular dynamics simulations of water at hydrophobic and hydrophilic surfaces. In conjunction with a modified Poisson-Boltzmann equation, the trend of experimental double-layer capacitances is well reproduced. We show that the apparent Stern layer can be understood in terms of the dielectric profile of pure water. |
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