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A study of the optical properties and adhesion of zinc sulfide anti-reflection thin film coated on a germanium substrate |
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| Authors: | SAR FiroozifarA Behjat E KadivarSMB Ghorashi M Borhani Zarandi |
| Institution: | a Atomic & Molecular Group, Faculty of Physics, Yazd University, Yazd, Iran b Photonics Research Group, Engineering Research Center, Yazd University, Yazd, Iran c Physics Department, Persian Gulf University, Bushehr, Iran |
| Abstract: | To conduct this study, zinc sulfide (ZnS) thin films deposited on germanium (Ge) substrates were prepared by an evaporation method. The effects of deposition rate and annealing on the optical properties and adhesion of the ZnS thin films were investigated. The transmission intensity and the X-ray diffraction (XRD) pattern of the samples showed that the transmittance of the samples decreases by increasing the evaporation rates. However, with the increase of the annealing temperature, crystallinity of the thin films improves which, in turn, results in the enhancement of the transmission intensity in a far infrared region. The maximum grain size was obtained at the annealing temperature of 225 °C. Our experimental results also show that evaporation rate and annealing influences the adhesion of ZnS thin films to Ge substrates. |
| Keywords: | Annealing Optical properties ZnS Antireflection Adhesion Ge |
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