| 集成电路高功率微波易损性预测评估模型 |
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| 引用本文： | 方进勇,张治强,黄文华,江伟华.集成电路高功率微波易损性预测评估模型[J].强激光与粒子束,2009,21(4). |
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| 作者姓名： | 方进勇 张治强 黄文华 江伟华 |
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| 作者单位： | 1. 清华大学 电机系， 北京 100084； 2. 西北核技术研究所， 西安 710024 |
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| 基金项目： | 国家高技术研究发展计划(863计划) |
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| 摘 要： | 介绍了集成电路高功率微波易损性的基本概念，给出了利用人工神经网络建立集成电路高功率微波易损性预测评估模型的基本步骤，通过一个实例，对预测评估模型的有效性进行了检验。实践表明：人工神经网络作为一个有效工具，可以较好地应用到集成电路高功率微波易损性预测评估工作中。
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| 关 键 词： | 高功率微波 易损性评估模型 集成电路 人工神经网络 |
| 收稿时间： | 1900-01-01; |
High power microwave vulnerability estimation model of integrated circuit |
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| Fang Jinyong,Zhang Zhiqiang,Huang Wenhua,Jiang Weihua.High power microwave vulnerability estimation model of integrated circuit[J].High Power Laser and Particle Beams,2009,21(4). |
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| Authors: | Fang Jinyong Zhang Zhiqiang Huang Wenhua Jiang Weihua |
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| Institution: | 1. Department of Electrical Engineering, Tsinghua University, Beijing 100084, China; 2. Northwest Institute of Nuclear Technology, P. O. Box 69-13, Xi’an 710024, China |
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| Abstract: | The basic concept of the integrated circuit high power microwave(HPM) vulnerability was introduced as well as the main establishment processes of an integrated circuit high power microwave vulnerability estimation model. It is demonstrated by an example that the neural network is an effective method to evaluate high power microwave vulnerability effects of the integrated circuit. |
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| Keywords: | vulnerability model integrated circuit artifical neural network |
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