| NANOMECHANICAL MAPPING OF CARBON BLACK REINFORCED NATURAL RUBBER BY ATOMIC FORCE MICROSCOPY |
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| 作者姓名： | Toshio Nishi Hideyuki Nukaga So Fujinami Ken Nakajima |
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| 作者单位： | Department of Organic and Polymeric Materials, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro-ku, Tokyo 152-8552, Japan |
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| 摘 要： | Atomic force microscopy （AFM） has the advantage of obtaining mechanical properties as well as topographic information at the same time. By analyzing force-distance curves measured over two-dimensional area using Hertzian contact mechanics, Young＇s modulus mapping was obtained with nanometer-scale resolution. Furthermore, the sample deformation by the force exerted was also estimated from the force-distance curve analyses. We could thus reconstruct a real topographic image by incorporating apparent topographic image with deformation image. We applied this method to carbon black reinforced natural rubber to obtain Young＇s modulus distribution image together with reconstructed real topographic image. Then we were able to recognize three regions; rubber matrix, carbon black （or bound rubber） and intermediate regions. Though the existence of these regions had been investigated by pulsed nuclear magnetic resonance, this paper would be the first to report on the quantitative evaluation of the interfacial region in real space.
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| 关 键 词： | 天然橡胶 黑烟末 聚合物 高分子化学 |
| 收稿时间： | 2006-06-16 |
| 修稿时间： | 2006-07-06 |
NANOMECHANICAL MAPPING OF CARBON BLACK REINFORCED NATURAL RUBBER BY ATOMIC FORCE MICROSCOPY |
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| Toshio Nishi Hideyuki Nukaga So Fujinami Ken Nakajima.NANOMECHANICAL MAPPING OF CARBON BLACK REINFORCED NATURAL RUBBER BY ATOMIC FORCE MICROSCOPY[J].Chinese Journal of Polymer Science,2007,0(1):35-41. |
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| Authors: | Toshio Nishi Hideyuki Nukaga So Fujinami Ken Nakajima |
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| Institution: | Department of Organic and Polymeric Materials, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro-ku, Tokyo 152-8552, Japan |
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| Abstract: | Atomic force microscopy (AFM) has the advantage of obtaining mechanical properties as well as topographic information at the same time. By analyzing force-distance curves measured over two-dimensional area using Hertzian contact mechanics, Young's modulus mapping was obtained with nanometer-scale resolution. Furthermore, the sample deformation by the force exerted was also estimated from the force-distance curve analyses. We could thus reconstruct a real topographic image by incorporating apparent topographic image with deformation image. We applied this method to carbon black reinforced natural rubber to obtain Young's modulus distribution image together with reconstructed real topographic image.Then we were able to recognize three regions; rubber matrix, carbon black (or bound rubber) and intermediate regions.Though the existence of these regions had been investigated by pulsed nuclear magnetic resonance, this paper would be the first to report on the quantitative evaluation of the interfacial region in real space. |
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| Keywords: | AFM Natural rubber Carbon black Young's modulus Force-distance curve ATOMIC FORCE MICROSCOPY NATURAL RUBBER REINFORCED CARBON BLACK paper would report quantitative evaluation interfacial regions real space existence nuclear magnetic resonance intermediate bound carbon black rubber matrix able recognize |
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