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Effect of surface preparation technique on the radiation detector performance of CdZnTe
Authors:MC Duff  DB Hunter  M Groza  DR Black
Institution:a Savannah River National Laboratory (SRNL), Aiken, SC 29808, USA
b Fisk University, Nashville, TN 37208-3051, USA
c National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899-8520, USA
Abstract:Synthetic CdZnTe (CZT) semiconducting crystals are highly suitable for the room temperature-based detection of gamma radiation. The surface preparation of Au contacts on surfaces of CZT detectors is typically conducted after (1) polishing to remove artifacts from crystal sectioning and (2) chemical etching, which removes residual mechanical surface damage however etching results in a Te rich surface layer that is prone to oxidize. Our studies show that CZT surfaces that are only polished (as opposed to polished and etched) can be contacted with Au and will yield lower surface currents. Due to their decreased dark currents, these as-polished surfaces can be used in the fabrication of gamma detectors exhibiting a higher performance than polished and etched surfaces with relatively less peak tailing and greater energy resolution.
Keywords:Radiation detectors  X-ray topography (crystal defects)  Resistivity  X-ray topographic imaging
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