Interfacial roughness and angle dependence of giant magnetoresistance in magnetic superlattices |
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| Authors: | L Sheng HY Teng DY Xing |
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| Institution: | (1) Department of Physics and Texas Center for Superconductivity, University of Houston, Houston, Texas 77204, USA, US;(2) National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093, and Department of Physics and the Center for Nonlinear Studies, Hong Kong Baptist University, Hong Kong, China, CN |
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| Abstract: | Using the two-point conductivity formula, we numerically evaluate the giant magnetoresistance (GMR) in magnetic superlattices
with currents in the plane of the layers (CIP), from which the effect of the interfacial roughness and magnetization configuration
on the GMR is studied. With increasing interfacial roughness, the maximal GMR ratio is found to first increase and then decrease,
exhibiting a peak at an optimum strength of interfacial roughness. For systems composed of relatively thick layers, the GMR
is approximately proportional to ,where is the angle between the magnetizations in two successive ferromagnetic layers, but noticeable departures from this dependence
are found when the layers become sufficiently thin.
Received 21 September 1998 and Received in final form 22 December 1998 |
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| Keywords: | PACS 75 70 Pa Giant magnetoresistance - 75 70 -i Magnetic films and multilayers - 72 10 Bg General formulation of transport theory - 72 15 Gd Galvanomagnetic and other magnetotransport effects |
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