| 无机质谱法在固体直接分析中的应用 |
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| 引用本文： | 张伯超,杭 纬,黄本立.无机质谱法在固体直接分析中的应用[J].中国无机分析化学,2011,1(1):13-23. |
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| 作者姓名： | 张伯超 杭 纬 黄本立 |
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| 作者单位： | 厦门大学化学化工学院，福建 厦门 361005;厦门大学化学化工学院，福建 厦门 361005;厦门大学化学化工学院，福建 厦门 361005 |
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| 摘 要： | 本文归纳了无机质谱法在固体直接分析中的应用,并详细阐述了辉光放电质谱法(GDMS)、二次离子质谱法(SIMS)、激光溅射电感耦合等离子体质谱法(LA-ICPMS)和激光电离质谱法(LIMS)四种可用于固体样品直接检测的无机质谱法的检测原理、应用以及各自的优缺点.
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| 关 键 词： | 无机质谱法 固体分析 应用 |
| 收稿时间： | 2010/12/15 0:00:00 |
| 修稿时间： | 2010/12/28 0:00:00 |
The application of inorganic mass spectrometry in direct solid analysis |
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| ZHANG Bochao,HANG Wei and HUANG Benli.The application of inorganic mass spectrometry in direct solid analysis[J].Chinese Journal of Inorganic Analytical Chemistry,2011,1(1):13-23. |
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| Authors: | ZHANG Bochao HANG Wei and HUANG Benli |
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| Institution: | College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China;College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China;College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China |
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| Abstract: | Inorganic mass spectrometry plays an important role in the analysis of solid samples. In this paper, four mass spectrometry techniques including glow discharge mass spectrometry (GDMS), secondary ion mass spectrometry (SIMS), laser ionization mass spectrometry (LIMS), and laser ablation inductively coupled plasma mass spectrometry (LA-ICPMS) were reviewed. The principle of instrumental analysis, applications, advantages and shortages for each technique were described. |
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