|
|||||
|
|
Quantitative analysis of binary alloys by XPS |
|
| Authors: | Maria F. Ebel |
| Affiliation: | Institut für Technische Physik der Technischen Hochschule Wien Vienna, Austria |
| Abstract: | A rapid method for a quantitative analysis of a multielement alloy is discussed. This method is independent of surface-roughness and contaminations. Co |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ | |