单幅对称变形相位图分离二维变形分量的相移电子散斑干涉技术

提出了利用相移电子散斑干涉测量物体二维变形分量的方法.单光束照明的传统电子散斑干涉技术,测量得到的是一幅物体变形的混合相位场.当物体具有对称变形时,可由这一幅相位图求得二维变形分量.方法是将该相位图镜像翻转得到第二幅相位图,通过二幅相位图的叠加、复位和分离运算,获得物体的二维变形场的分量值.利用三点加载的简支梁进行了实验,给出了实验结果,并与对称光照明实验结果进行了对比,验证了该方法的正确性.

Isolation of Two-dimensional Displacement Components of Symmetrical Deformation by Using One Phase Map in Phase-shifting Electronic Speckle Pattern Interferometry

A method about two-dimensional displacement measurement by using phase-shifting Electronic Speckle Pattern Interferometry(ESPI) is presented. When the typical ESPI is used for displacement measurement, a mixed phase distribution of deformation can be measured. If the deformation of the object is symmetrical, two components of deformation can be obtained by the mixed phase distribution. Turning over the phase map first to obtain the second phase map, then overlapping the two phase maps, the two displacement components can be separated by further boundary alignment and algebraic calculation between the two phase maps. This method has been proved feasible in a typical three-point-bending experiment. Some experimental results are offered and compared with the results obtained by dual-beam symmetrical illuminations experiment.