Structure, surface morphological and opto-electronic properties of zinc sulphide thin films deposited by dip method |
| |
| Authors: | P.P. Hankare P.A. Chate D.J. Sathe A.A. Patil |
| |
| Affiliation: | aDept. of Chemistry, Shivaji University, Kolhapur, (M.S.) India;bDept. of Chemistry, J.S.M. College, Alibag, (M.S.) India;cDept. of Chemistry, KIT's college of Engineering, Kolhapur, (M.S.) India |
| |
| Abstract: | ZnS thin films have been deposited by dip technique using succinic acid as a complexing agent. The structural and morphological characterizations of films have been investigated by X-ray diffraction, scanning electron microscope. X-ray pattern shows crystalline has hexagonal structure. The films show that good optical properties high absorption and band gap value was found to be 3.7 eV. The specific conductivity of the film was found to be in order of 10−5 (Ω cm)−1 and showing n-type conduction. |
| |
| Keywords: | Dip technique X-ray diffraction Surface morphology Growth mechanism |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
