Soft ESD phenomena in GMR heads in the HDD manufacturing process |
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| Institution: | 1. Matsushita-Kotobuki Electronics Industries, Ltd., 247 Fukutake, Saijo, Ehime 793-8510, Japan;2. Matsushita-Kotobuki Electronics Industries, Ltd., 2550 Hiromi, Ipponmatsu-cho, Ehime 798-33965, Japan;1. School of Materials Science and Engineering, Pusan National University, Busan 46241, Republic of Korea;2. Powder Technology Department, Korea Institute of Materials Science, Changwon 51508, Republic of Korea;1. Materials Science Centre, Department of Nuclear Physics, University of Madras, Guindy Campus, Chennai 600025, India;2. Department of Inorganic Chemistry, University of Madras, Guindy Campus, Chennai 600025, India;1. Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany;2. Department Material Physics, Montanuniversität, Leoben, Austria;3. Institute for Lightweight Design and Structural Biomechanics, Vienna University of Technology (TU Wien), Vienna, Austria;4. Institute of Mechanics, Montanuniversität, Leoben, Austria;1. School of Materials Science and Engineering, Central South University, Changsha 410083, China;2. Division of Nano Metrology and Materials Measurement, National Institute of Metrology, Beijing 100013, China;1. Department of Bio-Nano Technology, Hanyang University ERICA, Ansan 15588, Republic of Korea;2. Department of Materials Science and Chemical Engineering, Hanyang University ERICA, Ansan 15588, Republic of Korea;1. Department of Materials Science and Engineering, Yonsei University, Yonsei-ro 50, Seodaemun-gu, Seoul 03722, Republlic of Korea;2. Department of Welding and Joining Science Engineering, Chosun University, 309 Pilmun-daero, Dong-gu, Gwangju 61452, Republic of Korea |
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| Abstract: | GMR (giant magnetoresistive) heads used for HDD (hard disk drives) are very sensitive to ESD (electrostatic discharge). Some kinds of ESD damages will cause soft magnetic degradations of head performance with a progressive nature. We report examples of head degradations by ESD damages as well as other damages due to head scratches, electro-migration effects and corrosion of GMR stack. It is usually very difficult to distinguish these phenomena explicitly by QST (quasistatic tester) and spinstand measurement test. We show that head scratches can cause damages similar to damages caused by ESD and that re-magnetization has certain potential to correct the damaged magnetic structure caused by such scratches. |
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