Green route fast synthesis and characterization of chemical bath deposited nanocrystalline ZnS buffer layers |
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Authors: | GL Agawane Seung Wook Shin Min Sung Kim MP Suryawanshi KV Gurav AV Moholkar Jeong Yong Lee Jae Ho Yun PS Patil Jin Hyeok Kim |
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Institution: | 1. Department of Materials Science and Engineering, Chonnam National University, Gwangju 500-757, Republic of Korea;2. Center for Nanomaterials and Chemical Reactions, Institute for Basic Science, Daejeon 305-701, Republic of Korea;3. Electrochemical Materials Laboratory, Department of Physics, Shivaji University, Kolhapur 416 004, India;4. Photovoltaic Research Group, KIER, Jang-Dong, Yuseong-Gu, Daejeon 305-343, Republic of Korea;5. Department of Materials Science and Engineering, KAIST, Daejeon 305-701, Republic of Korea |
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Abstract: | Zinc sulphide (ZnS) thin films are deposited using chemical bath deposition method on the glass substrates in an aqueous alkaline reaction bath of zinc acetate and thiourea along with non-toxic complexing agent tri-sodium citrate at 95 °C. The results show noteworthy improvement in the growth rate of the deposited ZnS thin films and thickness of the film increases with the deposition time. From X-ray diffraction patterns, it is found that the ZnS thin films exhibit hexagonal polycrystalline phase reflecting from (101) and (0016) planes. The high resolution transmission electron microscopy studies confirmed the formation of hexagonal phase from the d-value calculation which was 0.3108 nm. X-ray photoelectron spectroscopy reveals that the Zn–S bonding energy is at 1022.5 and 162.1 eV for Zn 2p3/2 and S 2p1/2 states, respectively. Field emission scanning electron microscopy study shows that deposited thin films are highly uniform, with thin thickness and completely free from large ZnS clusters which usually form in aqueous solutions. Atomic force microscopy investigates that root mean square values of the ZnS thin films are from 3 to 4.5 nm and all the films are morphologically smooth. Energy dispersive spectroscopy shows that the ZnS thin films are relatively stoichiometric having Zn:S atomic ratio of 55:45. It is shown by ultraviolet–visible spectroscopy that ~90% transmittance and ~10% absorbance for the ZnS films in the visible region, which is significantly higher than that reported elsewhere and the band gap energy of the ZnS films is found to be 3.76, 3.74, and 3.71 eV, respectively. |
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