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Effects of CZSi furnace modification on density of grown-in defects
Authors:Bingyan?Ren  author-information"  >  author-information__contact u-icon-before"  >  mailto:Liucaichi@eyou.com"   title="  Liucaichi@eyou.com"   itemprop="  email"   data-track="  click"   data-track-action="  Email author"   data-track-label="  "  >Email author,Zhicheng?Zhang,Caichi?Liu,Qiuyan?Hao,Meng?Wang
Affiliation:Semiconductor Materials Research Institute, Hebei University of Technology, Tianjin 300130, China
Abstract:During large diameter Czochralski silicon growth, heat zone and argon flow influence the formation of defects in silicon crystal by changing the distribution of temperature. Different silicon crystals with various density of grown-in defects were grown by replacing the popular heater with the composite heater and changing the popular argon flow into a controlled flow. The experimental results have been explained well by the numeric simulation of argon flow.
Keywords:CZSi  grown-in defects  heat zone  argon flow  numeric simulation
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