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Quantification of fluorine density in the outermost atomic layer
Authors:van de Grampel R D  Ming W  Gildenpfennig A  Laven J  Brongersma H H  de With G  van der Linde R
Affiliation:Laboratory of Coatings Technology, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands.
Abstract:The outermost atomic layer of perfluorinated thiol monolayers on gold and poly(tetrafluoroethylene) (PTFE) is analyzed by low-energy ion scattering. Absolute quantification of fluorine density in this layer was achieved after calibrating the fluorine signal with a freshly cleaved LiF(100) single crystal. The fluorine density of monolayers of a C8F17-thiol on gold was 1.48 x 10(15) F atoms/cm2, whereas for PTFE a value of 1.24 x 1015 F atoms/cm2 was observed. This difference was explained by the different tilt angles of the thiol on gold and PTFE chains with respect to the surface normal. Both a configurational and a molecular interpretation on the perfluorinated thiol monolayer on gold are given.
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