Quantification of fluorine density in the outermost atomic layer |
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Authors: | van de Grampel R D Ming W Gildenpfennig A Laven J Brongersma H H de With G van der Linde R |
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Affiliation: | Laboratory of Coatings Technology, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands. |
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Abstract: | The outermost atomic layer of perfluorinated thiol monolayers on gold and poly(tetrafluoroethylene) (PTFE) is analyzed by low-energy ion scattering. Absolute quantification of fluorine density in this layer was achieved after calibrating the fluorine signal with a freshly cleaved LiF(100) single crystal. The fluorine density of monolayers of a C8F17-thiol on gold was 1.48 x 10(15) F atoms/cm2, whereas for PTFE a value of 1.24 x 1015 F atoms/cm2 was observed. This difference was explained by the different tilt angles of the thiol on gold and PTFE chains with respect to the surface normal. Both a configurational and a molecular interpretation on the perfluorinated thiol monolayer on gold are given. |
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