Moiré interferometry for thermal expansion of composites |
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Authors: | D. E. Bowles D. Post C. T. Herakovich D. R. Tenney |
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Affiliation: | (1) Virginia Polytechnic Institute and State University, 24061 Blacksburg, VA;(2) NASA-Langley Research Center, 23665 Hampton, VA |
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Abstract: | Techniques were developed for high-sensitivity moiré interferometry by reflection, using a real reference grating of 1200 lines/mm (30,000 /in.). Coefficients of thermal expansion of selected graphite-epoxy laminates were determined in the temperature range of 297 K (75°F) to 422 K (300°F). Very good precision was achieved for a wide range of thermal-expansion coefficients, from approximately zero to 27 ![mgr](/content/c56lkr27p3t7523n/xxlarge956.gif) /K.D.E. Bowles was a Graduate Student at Virginia Polytechnic Institute and State University when this research was conducted; is currently Materials Engineer at NASA-Langley Research Center, Hampton, VA 23665Paper was presented at 1981 SESA Spring Meeting held in Dearborn, MI on May 31–June 4. |
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