| 单道工序能力指数与单道工序成品率关系的研究 |
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| 引用本文： | 石林初.单道工序能力指数与单道工序成品率关系的研究[J].微电子技术,1998(1). |
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| 作者姓名： | 石林初 |
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| 作者单位： | 中国华晶电子集团公司双极电路总厂!无锡，214061 |
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| 摘 要： | 单边工序能力指数Cp和单道工序的成品率y是全面质量管理TQC（TotaQualityControl）中的两个关键本数。本文利用余误差函数表，用线性描值修正法计算了不同Cp时的y值，给出了对应在格，从而大大方便了数理统计方法在工业化大生产中的实际应用。
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| 关 键 词： | 工序能力指数 成品率 数理统计方法 |
A Study on the Relationship between the Processing-Capability-Index and Yield of One Step |
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| Shi Linchu.A Study on the Relationship between the Processing-Capability-Index and Yield of One Step[J].Microelectronic Technology,1998(1). |
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| Authors: | Shi Linchu |
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| Institution: | China Huajing Elertronics Group Corporation Wuxi 214061 |
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| Abstract: | The pmeessing-capability-index Cp and yield y of one step are all key param -eters in Total Quality Control(TQC). Based on the numerical table of the errorfunction-complement, different values of y vs. Cp are calculated by means of linear interpolatingmethod in this paper, and a table of y vs. Cp is also given that will be very convenient toapply the mathemat ics- stat ist ical method to the indust rial mass production. |
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| Keywords: | Processing-Capability-Index Yied Mathematics-Statistical Methed |
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