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Graphical representation of reflection from single and double coating systems on metallic substrate |
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| Authors: | N Barakat S Mokhtar W Osman |
| Affiliation: | (1) National Institute of Standards, Cairo, Egypt;(2) Faculty of Science, Ain Shams University, Cairo, Egypt;(3) Faculty of Science, Cairo University, Cairo, Egypt |
| Abstract: | In the present work a new graphical method is described to represent the resultant of the multiply reflected waves from coating systems consisting of single and double layers on metallic substrate, taking into account the optical phase properties of the films. |
| Keywords: | Reflection coefficient thin film optics optical constants tellurium silicon monoxide films double coating |
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