Development of a new approach to trace element analysis using neutron activation followed by high resolution X-ray spectrometry

The interference of beta particles with the measurement of X-rays with Si(Li) detectors, is eliminated by the use of magnetic fields. The latter defect the beta particles preventing them to reach the detector, but have no effect on the X-rays to be measured. Thus the high background which obscures the X-ray peaks of low and medium Z elements is reduced to a minimum and the resolution of the detector restored to ist normal value. As a result the X-ray peaks may be accurately integrated. Several experiments which show the usefulness of the method are discussed. This work was supported by the U.S.-Israel Binational Science Foundation.