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X射线荧光光谱法测定高纯石墨中的硫
引用本文:盛向军,曹冬梅,陈新.X射线荧光光谱法测定高纯石墨中的硫[J].光谱实验室,2002,19(2):250-252.
作者姓名:盛向军  曹冬梅  陈新
作者单位:辽宁出入境检验检疫局技术中心,辽宁省大连市人民路81号,116001
摘    要:采用X射线荧光光谱法测定出口高纯石墨中的硫,代替传统的化学分析方法。原样品粉末直接压片,标准样品采用国际焦炭样品和淀粉按比例混匀经研磨后压片,采用散射线背景校正法校正基体的影响,效果良好,简便易行。本方法的精与准确度均较好。

关 键 词:X射线荧光光谱  背景校正  高纯石墨    测定  杂质
文章编号:1004-8138(2002)02-0250-03
修稿时间:2001年11月19

Determination of Sulphur in Graphite Electrode Powder by XRF
SHENG Xiang,Jun,CAO Dong,Mei,CHEN Xin.Determination of Sulphur in Graphite Electrode Powder by XRF[J].Chinese Journal of Spectroscopy Laboratory,2002,19(2):250-252.
Authors:SHENG Xiang  Jun  CAO Dong  Mei  CHEN Xin
Abstract:Pressed powder pellets of graphite electrode powder were used to determine the content of sulphur instead of wet chemical analysis by XRF.Calibration curve was prepared by Chinese coke standards mixed with starch.The size of sample and the press of pellets were also tested so as to find the best analysis conditions.The scattering background intensity was used as a reference to correct the matrix effect.The precision and accuracy of the results meet the requirement for the powder quality analysis.
Keywords:XRF  Graphite Electrode Powder  Background Correction    
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