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求延时限制下面积最小化工艺映射
引用本文:彭宇行,陈福接.求延时限制下面积最小化工艺映射[J].电子学报,1996,24(8):108-110.
作者姓名:彭宇行  陈福接
作者单位:国防科技大学计算机研究所
基金项目:“8.5同构型多处理机系统结构”研究经费资助
摘    要:随着VLSI技术的发展,工艺映射的目标从面积最小化转向为延时限制下的面积最小化。然而,求延时限制下面积最小化工艺映射技术仅仪在近地阶段。本文给出求解该问题的精确算法以及有关理论结果。

关 键 词:电子CAD  工艺映射  延时分析  VLSI

A Technology Mapping Algorithm for Area Optimization under Delay Constraint
Peng Yuxing,Chen Fujie.A Technology Mapping Algorithm for Area Optimization under Delay Constraint[J].Acta Electronica Sinica,1996,24(8):108-110.
Authors:Peng Yuxing  Chen Fujie
Abstract:As the development of VLSI design, the target of the technology mapping has been changed into minimizing area under delay constraint from area optimization. However,there exist only near optimal algorithms for the target up to now. This paper presents a theoretical breakthrough showing that the technology mapping problem for Area Optimization under Delay Constraint can be solved optimally by our algorithm.
Keywords:Electronic CAD  Technology mapping  Timing analysis
本文献已被 CNKI 维普 等数据库收录!
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